Cepstral Scanning Transmission Electron Microscopy Imaging of Severe Lattice Distortions

Abstract

The development of four-dimensional (4D) scanning transmission electron microscopy (STEM) using fast detectors has opened-up new avenues for addressing some of long-standing challenges in electron imaging. One of these challenges is how to image severely distorted crystal lattices, such as at a dislocation core. Here we introduce a new 4D-STEM technique, called Cepstral STEM, for imaging disordered crystals using electron diffuse scattering. Local fluctuations of diffuse scattering are captured by scanning electron nanodiffraction (SEND) using a coherent probe. The harmonic signals in electron diffuse scattering are detected through Cepstral analysis and used for imaging. By integrating Cepstral analysis with 4D-STEM, we demonstrate that information about the distortive part of electron scattering potential can be separated and imaged at nm spatial resolution. We apply our technique to the analysis of a dislocation core in SiGe and lattice distortions in high entropy alloy.