Self-calibration technique for characterization of integrated THz waveguides

Abstract

Emerging high-frequency accelerator technology in the terahertz regime is promising for the development of compact high-brightness accelerators and high resolution-power beam diagnostics. One resounding challenge when scaling to higher frequencies and to smaller structures is the proportional scaling of tolerances which can hinder the overall performance of the structure. Consequently, characterizing these structures is essential for nominal operation. Here, we present a novel and simple self-calibration technique to characterize the dispersion relation of integrated hollow THz-waveguides. The developed model is verified in simulation by extracting dispersion characteristics of a standard waveguide a priori known by theory. The extracted phase velocity does not deviate from the true value by more than $ 9 \times 10^{-5} ~\%$. In experiments the method demonstrates its ability to measure dispersion characteristics of non-standard waveguides embedded with their couplers with an accuracy below $ \approx 0.5~\% $ and precision of $ \approx 0.05~\% $. Equipped with dielectric lining the metallic waveguides act as slow wave structures, and the dispersion curves are compared without and with dielectric. A phase synchronous mode, suitable for transverse deflection, is found at $ 275~\text{GHz} $.