Single-shot wide-field optical section imaging

Abstract

Optical sectioning technology has been widely used in various fluorescence microscopes owing to its background removing capability. Here, a virtual HiLo based on edge detection (V-HiLo-ED) is proposed to achieve wide-field optical sectioning, which requires only single wide-field image. Compared with conventional optical sectioning technologies, its imaging speed can be increased by at least twice, meanwhile maintaining nice optical sectioning performance, low cost, and excellent artifact suppression capabilities. Furthermore, the new V-HiLo-ED can also be extended to other non-fluorescence imaging fields. This simple, cost-effective and easy-to-extend method will benefit many research and application fields that needs to remove out-of-focus blurred images.

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