Hole conductivity through a defect band in ZnGa2O4
Abstract
Semiconductors with wide band gap (3.0 eV), high dielectric constant (> 10), good thermal dissipation, and capable of n- and p-type doping are highly desirable for high-energy power electronic devices. Recent studies indicate that ZnGa2O4 may be suitable for these applications, standing out as an alternative to Ga2O3. The simple face centered cubic spinel structure of ZnGa2O4 results in isotropic electronic and optical properties, in contrast to the large anisotropic properties of the β-monoclinic Ga2O3. In addition, ZnGa2O4 has shown, on average, better thermal dissipation and potential for n- and p-type conductivity. Here we use density functional theory and hybrid functional calculations to investigate the electronic, optical, and point defect properties of ZnGa2O4, focusing on the possibility for n- and p-type conductivity. We find that the cation antisite GaZn is the lowest energy donor defect that can lead to unintentional n-type conductivity. The stability of self-trapped holes (small hole polarons) and the high formation energy of acceptor defects make it difficult to achieve p-type conductivity. However, with excess of Zn, forming Zn(1+2x)Ga2(1-x)O4 alloys display an intermediate valence band, facilitating p-type conductivity. Due to the localized nature of this intermediate valence band, p-type conductivity by polaron hopping is expected, explaining the low mobility and low hole density observed in recent experiments.