Transient Characteristics of β-Ga2O3 Nanomembrane Schottky Barrier Diodes on Various Substrates

Abstract

In this paper, a transient delayed rising and fall time of β-Ga2O3 NMs Schottky barrier diodes (SBDs) formed on four different substrates (diamond, Si, sapphire, and polyimide) were measured using a sub-micron second resolution time-resolved electrical measurement system under a different temperature condition. The devices exhibited noticeably less-delayed turn-on-/off- the transient time when β-Ga2O3 NMs SBDs were transfer-printed on a high-k substrate. Furthermore, a relationship between the β-Ga2O3 NM thicknesses and their transient characteristics were systematically investigated and found that phonon scattering plays an important role in heat dissipation as the thickness of β-Ga2O3 NMs get thinner which is also verified by the Multiphysics simulator. Overall, our result reveals the impact of various substrates with different thermal properties and different eta- Ga2O3 NMs thickness with the performance of β-Ga2O3 NMs based devices. Hence, these results can guide further efforts us to optimize the performance of future β-Ga2O3 devices by maximizing heat dissipation from the β-Ga2O3 layer.

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