Thermal drag effect in quantum Hall circuits
Abstract
We study the thermal drag between two mesoscopic quantum Hall (QH) circuits. Each circuit consists of Ohmic contact perfectly coupled to quantum Hall edge states. The drag is caused by strong capacitive coupling between Ohmic contacts. The non-equilibirum conditions and the electron-electron interaction are taken into account by using the non-equilibrium bosonization technique. The thermal drag current in the passive circuit, the noise power of the corresponding heat current, and the Fano factor are calculated and analyzed.
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