Quantum circuit debugging and sensitivity analysis via local inversions

Abstract

As the width and depth of quantum circuits implemented by state-of-the-art quantum processors rapidly increase, circuit analysis and assessment via classical simulation are becoming unfeasible. It is crucial, therefore, to develop new methods to identify significant error sources in large and complex quantum circuits. In this work, we present a technique that pinpoints the sections of a quantum circuit that affect the circuit output the most and thus helps to identify the most significant sources of error. The technique requires no classical verification of the circuit output and is thus a scalable tool for debugging large quantum programs in the form of circuits. We demonstrate the practicality and efficacy of the proposed technique by applying it to example algorithmic circuits implemented on IBM quantum machines.