Tuning the perpendicular anisotropy of ferromagnetic films by thickness, width, and profile

Abstract

Perpendicular magnetic anisotropy was found to be highly sensitive to the nominal thickness and morphology of laterally heterogeneous CoPd films in the vicinity of the metal insulator transition. We used the effect to tune the anisotropy by the width of lithographically patterned stripes with non-uniform cross-sectional thickness profiles. The phenomenon and the method can be suitable to control the local anisotropy of spintronic logic circuitry elements by their shape and lateral dimensions.