Moir\'e Modulated Lattice Strain and Thickness-Dependent Lattice Expansion in Epitaxial Ultrathin Films of PdTe2

Abstract

We report the epitaxial growth of PdTe2 ultrathin films on topological insulator Bi2Se3. A prominent Moir\'e pattern was observed in STM measurements. The Moir\'e periodicity increases as film thickness decreases, indicating a lattice expansion of epitaxial PdTe2 thin films with lower thicknesses. In addition, our simulations based on Moir\'e Metrology reveal uniaxial lattice strains at the edge of PdTe2 domains, and anisotropic strain distributions throughout the Moir\'e supercell with a net change in lattice strain up to ~2.9%. Our DFT calculations show that this strain effect leads to a narrowing of the band gap at point near the Fermi level. Under a strain of ~2.8%, the band gap at closes completely. Further increasing the lattice strain makes the band gap reopen and the order of conduction band and valence bands inverted in energy. The results offer a proof of concept for constructing quantum grids of topological materials under the modulation of Moir\'e potentials.

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