The structure of Tick-borne Encephalitis virus determined at X-Ray Free-Electron Lasers. Simulations

Abstract

The study of the structure of viruses by X-ray free-electron lasers (XFEL) attracts more attention in recent decades. Such experiments are based on the collection of two-dimensional diffraction patterns measured at the detector after diffraction of femtosecond X-ray pulses on biological samples. In order to prepare the experiment at the European XFEL we simulated the diffraction data for the tick-borne encephalitis virus (TBEV) with different parameters and identified their optimal values. Following necessary steps of a well-established data processing pipeline, the structure of TBEV was obtained and the efficiency of the used methods was demonstrated.