Certification of the maximally entangled state using non-projective measurements

Abstract

In recent times, device-independent certification of quantum states has been one of the intensively studied areas in quantum information. However, all such schemes utilise projective measurements which are practically difficult to generate. In this work, we consider the one-sided device-independent (1SDI) scenario, and propose a self-testing scheme for the two-qubit maximally entangled state using non-projective measurements, in particular, three three-outcome extremal POVM's. We also analyse the robustness of our scheme against white noise.