Emergence symmetry protected topological phase in spatially tuned measurement-only circuit

Abstract

Topological phase transition induced by spatially-tuned single-site measurement is investigated in a measurement-only circuit, in which three different types of projective measurement operator. Specific spatial setting and combination of commutation relations among three measurement operators generate such a transition. In practice, symmetry protected topological (SPT) phase is recovered on even sublattice by eliminating a projective measurement disturbing the SPT via applying another spatially-tuned projective measurement on odd sublattice. We further investigate the critical properties of the phase transition and find that it has the same critical exponents with the two-dimensional percolation transition.