Bi layer properties in the Bi-FeNi GMR-type structures probed by spectroscopic ellipsometry

Abstract

Bismuth (Bi) having a large atomic number is characterized by the strong spin-orbit coupling (SOC) and is a parent compound of many 3D topological insulators (TIs). The ultrathin Bi films are supposed to be 2D TIs possessing the nontrivial topology, which opens the possibility of developing new efficient technologies in the field of spintronics. Here we aimed at studying the dielectric function properties of ultrathin Bi/FeNi periodic structures using spectroscopic ellipsometry. The [Bi(d)-FeNi(1.8 nm)]N GMR-type structures were grown by rf sputtering deposition on Sitall-glass (TiO2) substrates. The ellipsometric angles Psi(omega) and Delta(omega) were measured for the grown series (d=0.6,1.4,2.0,2.5 nm, N=16) of the multilayered film samples at room temperature for four angles of incidence of 60, 65, 70, and 75 degrees in a wide photon energy range of 0.5-6.5 eV. The measured ellipsometric angles, Psi(omega) and Delta(omega), were simulated in the framework of the corresponding multilayer model. The complex (pseudo)dielectric function spectra of the Bi layer were extracted. The GMR effects relevant for the studied Bi-FeNi MLF systems are estimated from the optical conductivity zero-limit (optical GMR effect). The obtained results demonstrate that the Bi layer possesses the surface metallic conductivity induced by the SOC effects, which is strongly enhanced on vanishing the semimetallic-like phase contribution on decreasing the layer thickness, indicating its nontrivial 2D topology properties.