Using the inductive-energy participation ratio to characterize a superconducting quantum chip

Abstract

We developed an inductive energy participation ratio (IEPR) method and a streamlined procedure for simulating and verifying superconducting quantum chips. These advancements are increasingly vital in the context of large-scale, fault-tolerant quantum computing. Our approach efficiently extracts the key linear and nonlinear characteristic parameters, as well as the Hamiltonian of a quantum chip layout. In theory, the IEPR method provides insights into the relationship between energy distribution and representation transformation. We demonstrate its practicality by applying it to quantum chip layouts, efficiently obtaining crucial characteristic parameters in both bare and normal representations-an endeavor that challenges existing methods. Our work holds the promise of significant enhancements in simulation and verification techniques and represents a pivotal step towards quantum electronic design automation.