Adapted metrics on locally conformally product manifolds

Abstract

We show that the Gauduchon metric $g_0$ of a compact locally conformally product manifold $(M,c,D)$ of dimension greater than $2$ is adapted, in the sense that the Lee form of $D$ with respect to $g_0$ vanishes on the $D$-flat distribution of $M$. We also characterize adapted metrics as critical points of a natural functional defined on the conformal class.