On automatic determination of quasicrystal orientations by indexing of detected reflections

Abstract

Automatic crystal orientation determination and orientation mapping are important tools for research on polycrystalline materials. The most common methods of automatic orientation determination rely on detecting and indexing individual diffraction reflections. These methods, however, have not been used for orientation mapping of quasicrystalline materials. The paper describes necessary changes to existing software designed for orientation determination of periodic crystals so that it can be applied to quasicrystals. The changes are implemented in one of such programs. The functioning of the modified program is illustrated by an example orientation map of an icosahedral polycrystal.