Defect Localization in Flip-Chip Devices Using Space-Domain Reflectometry and Magnetic Current Imaging

Abstract

Magnetic Field Imaging (MFI) is the newest Fault Isolation/Failure analysis technique to non-destructively and non-invasively localize defects such as electrical shorts and opens in both the die and package levels of Flip-Chips. This is accomplished using Magnetic Current Imaging (MCI) and Space-Domain Reflectometry (SDR) techniques accompanied using a Giant Magneto-Resistor (GMR), which provides detailed spatial optical images at sub-micron resolutions to localize further and identify defects [1]. This paper will demonstrate the use of MCI to locate electrical shorts by imaging the magnetic fields induced by the current-carrying wire bonds using a Superconducting Quantum Interference Device (SQUID) [2], then implement SDR to locate electrical opens using SQUID and GMR to produce detailed optical images of the defect locations. The exact location of the defect can then be localized by using a CAD overlay of the circuit schematic with the optical and MCI images.