Prospects of CP violation in decay with polarized electron beam at STCF
Abstract
Based on 1.89 × 108 J/ → Monte Carlo (MC) events produced from a longitudinally-polarized electron beam, the sensitivity of CP violation of decay is studied with fast simulation software. In addition, the J/ → decay can also be used as a process to optimize the detector response using the interface provided by the fast simulation software. In the future, STCF is expected to obtain 3.4 trillion J/ events, and the statistical sensitivity of CP violation of decay via J/ → process is expected to reach O~(10-5) when the electron beam polarization is 80\%.
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