Reply to "Comment on newly found Charge Density Waves in infinite layer Nickelates''
Abstract
Charge density waves (CDW) have been reported in NdNiO2 and LaNiO2 thin films grown on SrTiO3 substrates using Ni-L3 resonant x-ray scattering in Refs. [1-3]. In their comment [arXiv:2306.15086] on these reports, Pelliciari et al. found no evidence for a CDW in a NdNiO2 film by performing fixed-momentum energy-dependent measurements. Instead, they observed a nearby non-resonant scattering peak, attributed to the (101) substrate reflection, made accessible at Ni-L3 due to third harmonic light contamination. Here we present fixed-momentum energy-dependent resonant inelastic x-ray scattering measurements across Ni-L3 on NdNiO2, used in the preceding study [1]. We see intrinsic Ni-L3 energy profiles at all measured Q values, including a strong resonance effect at QCDW = (-1/3, 0, 0.316) reciprocal lattice units. Attempts to measure the (101) substrate peak using third harmonic light at Ni-L3 at I21, Diamond were unfruitful. Our results clearly demonstrate the electronic origin of the scattering peak published in Ref. [1] and lack of a detectable structural component in the peak.
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