Rewiring driven evolution of quenched frustrated signed network

Abstract

A framework for studying the behavior of a classically frustrated signed network in the process of random rewiring is developed. We describe jump probabilities for change in frustration and formulate a theoretical estimate in terms of the master equation. Stationary thermodynamic distribution and moments are derived from the master equation and compared to numerical simulations. Furthermore, an exact solution of the probability distribution is provided through suitable mapping of rewiring dynamic to birth and death processes with quadratic asymptotically symmetric transition rates.