Haar basis testing
Abstract
We show that for two doubling measures σ and ω on Rn and any fixed dyadic grid D in Rn, \[ NRλ, n( σ,ω) ≈HRλ, nD,*glob( σ,ω) +HRλ, nD,*glob( ω, σ) \ , \] where NRλ, n (σ, ω) denotes the L2 (σ) L2 (ω) operator norm of the vector-Riesz transform Rλ, n of fractional order λ ≠ 1, and \[ HRλ,nD,*glob( σ,ω) I∈D Rλ,n hIσ L2( ω) \ , \] is the global Haar testing characteristic for Rλ,n on the grid D, and \ hIσ\ I∈D is the weighted Haar orthonormal basis of L2( σ) arising in the work of Nazarov, Treil and Volberg. We also show this theorem extends more generally to weighted Alpert wavelets which replace the weighted Haar wavelets in the proofs of some recent two-weight T1 theorems. Finally, we briefly pose these questions in the context of orthonormal bases in arbitrary Hilbert spaces.
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