Spontaneous polarization in NaNbO3 film on NdGaO3 and DyScO3 substrates

Abstract

Pure NaNbO3 is an antiferroelectric material at room temperature that irreversibly transforms to a ferroelectric polar state when subjected to an external electrical field or lattice strain. Experimentally, it has been observed that NaNbO3 films grown on NdGaO3 exhibit an electrical polarization along the [001]PC direction, whereas films on DyScO3 substrates exhibit a polarization along the [011]PC direction. These effects have been attributed to the realization of different lattice symmetries in the films due to the incorporation of lattice strain imposed by the use of oxide substrates with different lattice parameters. However, the underlying atomistic mechanisms of the resulting phase symmetry in the films are hardly clear, given that NaNbO3 features a diverse and complex phase diagram. In turn, these also impede a straightforward tailoring and optimization of the resulting macroscopic properties on different substrates. To clarify this issue, we perform all-electron first-principles calculations for several potential NaNbO3 polymorphs under stress and strain. The computed properties, including the ferroelectric polarization, reveal that an orthorhombic Pmc21 phase is realized on NdGaO3 substrates since this is the only phase with an out-of-plane polarization under a compressive strain. Conversely, the monoclinic Pm phase is consistent for the samples grown on DyScO3 substrate, since this phase exhibits a spontaneous in-plane polarization along [011]PC under tensile strain.

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