Modelling reliability of reversible circuits with 2D second-order cellular automata

Abstract

The cellular automaton is a widely known model of both reversible and irreversible computations. The family of reversible second-order cellular automata considered in this work is appropriate both for construction of logic gates and analysis of damage distribution. The quantities such as formal dimension of damage patterns can be used only for rough estimation of consequences of particular faults and numerical experiments are provided for illustration of some subtleties. Such analysis demonstrates high sensitivity to errors from defects, lack of synchronization and too short intervals between signals.