Morphological evolution and surface/interface Fe-oxide formation in epitaxial Fe(001)/MgO(001) thin film

Abstract

Epitaxial Fe film has been grown on ion beam sputtered MgO(001) substrate by electron beam evaporation. Reflection high energy electron diffraction (RHEED) and transport measurements (TM) were performed simultaneously during the growth of the film. While TM provided information about film morphology, RHEED provided information about the structure of the film.

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