Two-sample tests for relevant differences in persistence diagrams

Abstract

We study two-sample tests for relevant differences in persistence diagrams obtained from Lp-m-approximable data (Xt)t and (Yt)t. To this end, we compare variance estimates w.r.t.\ the Wasserstein metrics on the space of persistence diagrams. In detail, we consider two test procedures. The first compares the Fr\'echet variances of the two samples based on estimators for the Fr\'echet mean of the observed persistence diagrams PD(Xi) (1 i m), resp., PD(Yj) (1 j n) of a given feature dimension. We use classical functional central limit theorems to establish consistency of the testing procedure. The second procedure relies on a comparison of the so-called independent copy variances of the respective samples. Technically, this leads to functional central limit theorems for U-statistics built on Lp-m-approximable sample data.

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