Entangled-Beam Reflectometry and Goos-H\"anchen Shift

Abstract

We introduce the technique of Entangled-Beam Reflectometry for extracting spatially correlated (magnetic or non-magnetic) information from material surfaces or thin films. Our amplitude- and phase-sensitive technique exploits the coherent nature of an incoming entangled probe beam, of matter or light waves, undergoing reflection from the surface. Such reflection encodes the surface spatial structure into the probe's geometric and phase-derived Goos-H\"anchen shifts, which can then be measured to unveil the structure. We investigate the way these shifts depend on the wave packet widths, and illustrate our technique in the case of in-plane periodic (non-)magnetic structures by utilizing spin-path mode-entangled neutron beams.