Protocol for certifying entanglement in surface spin systems using a scanning tunneling microscope

Abstract

Certifying quantum entanglement is a critical step towards realizing quantum-coherent applications of surface spin systems. In this work, we show that entanglement can be unambiguously shown in a scanning tunneling microscope (STM) with electron spin resonance by exploiting the fact that entangled states undergo a free time evolution with a distinct characteristic time constant that clearly distinguishes it from any other time evolution in the system. By implementing a suitable phase control scheme, the phase of this time evolution can be mapped back onto the population of one entangled spin in a pair, which can then be read out reliably using a weakly coupled sensor spin in the junction of the scanning tunneling microscope. We demonstrate through open quantum system simulations with realistic spin systems, which are currently available with spin coherence times of $T_2\approx$ 300 ns, that a signal directly correlated with the degree of entanglement can be measured at a temperature range of 100$-$400 mK accessible in sub-Kelvin cryogenic STM systems.