Magnetic X-ray imaging using a single polarization and multimodal-ptychography

Abstract

Polarized X-rays allow for imaging birefringent or dichroic properties of materials with nanometric resolution. To disentangle these properties from the electronic density, either a polarization analyzer or several measurements with different polarizations (typically two, or more) are needed. Here we demonstrate that ptychography can disentangle these from a single-polarization measurement by using a multimodal analysis. This new method provides an alternative to obtain polarization-resolved images of a sample when manipulating the incident polarization is not possible nor sufficient.