Sample Motion for Structured Illumination Fluorescence Microscopy

Abstract

Structured illumination microscopy (SIM) uses a set of images captured with different illumination patterns to computationally reconstruct resolution beyond the diffraction limit. Here, we propose an alternative approach using a single speckle illumination pattern and relying on inherent sample motion to encode the super-resolved information in multiple raw images. From a set of raw fluorescence images captured as the sample moves, we jointly estimate both the sample motion and the super-resolved image. We demonstrate the feasibility of the proposed method both in simulation and in experiment.