The influence of shot noise on the performance of phase singularity-based refractometric sensors

Abstract

Topological singularities of optical response functions -- such as reflection amplitudes -- enable elegant practical applications ranging from analog signal processing to novel molecular sensing approaches. A phase singularity-based refractometric sensor monitors the rapidly evolving argument of the optical field near the point of phase singularity, in contrast to the reflection zero in traditional surface plasmon polariton sensors. This raises a natural question: What happens with the sensitivity and resolution of such a sensor when it operates close to a zero of the response function, where the detected signal may be greatly influenced by various noise sources? In this paper, we systematically study the effect of the shot noise on the performance of a generic phase singularity-based refractometric sensor. We develop a theoretical model of a spectroscopic ellipsometry-based system operating near a phase singularity and couple the macroscopic optical picture of the detection with a quantum shot noise model. Within the developed model, we illustrate how the shot noise of the detector comes into play and study its effect on the sensitivity and resolution of the refractometric sensor. Our results suggest that such an ellipsometry-based phase singularity sensor remains stable even in the presence of shot noise near the point of zero reflection.