Towards Quantifying Two-Mode Correlation Linewidths in Quantum Circuits
Abstract
This paper aims to quantify the linewidth of two-mode correlations in Traveling Wave Parametric Amplifiers (TWPAs). Artifacts induced by data acquisition and processing, such as windowing effects and acquisition time, are examined to understand their influence on the linewidth estimation of these correlations. The findings underscore the significance of acquisition parameters in optimizing two-mode correlation measurements, enhancing device characterization for quantum applications.
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