Measurement of the Temperature Dependence of the Refractive Index of CdZnTe

Abstract

We have been developing a CdZnTe immersion grating for a compact high-dispersion mid-infrared spectrometer (wavelength range 10--18 $\mu$m, spectral resolution $R = \lambda/\Delta \lambda > 25,000$, operating temperature $T < 20$ K). Using an immersion grating, the spectrometer size can be reduced to $1/n$ ($n$: refractive index) compared to conventional diffraction gratings. CdZnTe is promising as a material for immersion gratings for the wavelength range. However, the refractive index $n$ of CdZnTe has not been measured at $T < 20$ K. We have been developing a system to precisely measure $n$ at cryogenic temperatures ($T \sim 10$ K) in the mid-infrared wavelength range. As the first result, this paper reports the temperature dependence of $n$ of CdZnTe at the wavelength of 10.68 $\mu$m. This system employs the minimum deviation method. The refractive index $n$ of CdZnTe is measured at temperatures of \( T = 12.57, 22.47, 50.59, 70.57, \text{ and } 298 \, \text{K} \). We find that $n$ of CdZnTe at $\lambda =$ 10.68 $\mu$m is $2.6371 \pm 0.0022$ at $12.57 \pm 0.14$ K, and the average temperature dependence of $n$ between 12.57 $\pm$ 0.14 K and 70.57 $\pm$ 0.23 K is $\Delta n/\Delta T = (5.8 \pm 0.3) \times 10^{-5}$ K$^{-1}$.