Crystal Growth & Physical Property Characterization of Mixed Topological Insulator BiSbTe$_3$

Abstract

This article reports the synthesis of a single crystalline mixed topological insulator (TI) BiSbTe$_3$ and its detailed structural and magneto-transport properties. The single crystalline samples of BiSbTe$_3$ are grown by the melt-growth process and characterized by X-ray diffraction (XRD), Energy dispersive X-ray analysis (EDAX) and Raman spectroscopy. The single crystal XRD peaks dictated the growth direction along the c-axis. The Raman spectrum elucidated the characteristic peaks of the mixed topological insulator. The broadening of Raman peaks exhibited the formation of Te-Bi-Te and Te-Sb-Te bonds and associated vibrational modes. The single crystals are characterized by magneto-transport measurements down to 2 K and up to 14 Tesla transverse magnetic field. The residual resistance ratio (R200 K/R0 K) is found to be 3.64, which endorses the metallic nature of the synthesized crystal. The relative resistance turns out to be higher for the mixed TI than the pure TIs i.e., Bi$_2$Te$_3$ or Sb$_2$Te$_3$. The lower Debye temperature (82.64 K) of BiSbTe$_3$ connotes the presence of effective electron-phonon interaction at quite low temperatures in comparison to pure TI, which explains the observed suppression in magnetoresistance (MR) for the mixed TI. At 2 K, an MR of 150 percent is observed for BiSbTe$_3$, which is suppressed in contrast to the pure TIs i.e., Bi$_2$Te$_3$ or Sb$_2$Te$_3$. Though the MR% is suppressed significantly, its non-saturating linear behavior indicates the topological nature of the studied mixed TI. The modified Hikami-Larkin-Nagaoka (HLN) equation analysis of magneto-conductivity of mixed TI revealed that the conductivity has not only a surface states driven 2D component but also contributions from the bulk charge carriers and quantum scattering.