Compact detector for atom-atom correlations on an atom chip

Abstract

We present a compact, ionization-based detector for the state-selective and spatially resolved measurement of individual Rydberg atoms trapped in the vicinity of an atom chip. The system combines an electrostatic lens system for guiding charged particles with an array of channel electron multipliers (CEMs) capable of detecting both ions and electrons produced by ionization. Designed for quantum information applications, this device enables the detection of correlations between spatially separated Rydberg qubits. Additionally, the electrodes provide compensation for stray electric fields and control over particle trajectories. The imaging system achieves a total magnification of more than 12, with a single-axis magnification up to 200, while maintaining low aberrations. We characterize the performance of the system using a charged particle trajectory simulation software and discuss how a coincidence measurement of ions and electrons can be used to calibrate the detection efficiency. This detector enables high-fidelity measurement of multiple Rydberg atoms and is well-suited for applications in cavity-mediated quantum gates.