Spin Squeezing in Electron Microscopy

Abstract

Quantum metrology experiments in atomic physics and quantum optics have demonstrated measurement accuracy beyond the shot-noise limit via multi-particle entanglement. At the same time, electron microscopy, an essential tool for high-resolution imaging of biological systems, is severely constrained in its signal-to-noise ratio (SNR) by shot noise, due to the dose limit imposed by electron beam-induced damage. Here, we show theoretically that spin squeezing, a form of quantum metrology based on entanglement, is a natural fit for improving the SNR in electron microscopy. We investigate the generation of the necessary entangled states through electron-electron Coulomb interactions and quantum non-demolition measurements. Our results connect the fields of quantum metrology and electron interferometry, paving the way toward electron microscopy with SNR beyond the shot-noise limit.