Probing Interface-Driven Mechanisms of Non-Classical Light in van der Waals Heterostructures

Abstract

Single-photon emitters in two-dimensional semiconductors offer a versatile platform for integrated quantum photonics, yet their performance is strongly influenced by local dielectric environments and substrate-induced disorder. Here, we examine SPEs in monolayer WSe2 incorporated into hBN/WSe2/Clinochlore van der Waals heterostructures and assess how interface-mediated dielectric modulation governs their optical and quantum characteristics. Low-temperature micro-photoluminescence reveals narrow emission lines (100 - 300 μeV) and robust non-classical behavior, with g(2)(0) = 0.13 0.02 on SiO2 and 0.54 0.02 for emitters directly coupled to Clinochlore. Magneto-optical measurements yield effective g-factors near -8, consistent with defect states hybridized with dark excitons. WSe2 on Clinochlore exhibits up to a fivefold enhancement in emission intensity, attributed to coupling with Fe-related substrate states that introduce resonant absorption near 1.75 eV. Kelvin probe force microscopy confirms strong dielectric contrast across thin and thick Clinochlore regions. Time-resolved photoluminescence shows that emitters on SiO2 display a single ≈ 4 ns lifetime, whereas those on Clinochlore exhibit biexponential dynamics with sub-nanosecond and tens-of-nanoseconds decay components. A phenomenological model incorporating coupling to bright and dark Fe-related states in Clinochlore accounts for modified excitation pathways. These results establish interface dielectric engineering in vdW heterostructures as an effective strategy for tailoring the radiative dynamics and brightness of quantum emitters in atomically thin materials.

0

Turn this paper into a full lesson

ArcXiv compiles a staged curriculum from this paper: 8-12 lessons across beginner → advanced, synthesised section guides, visuals, flashcards, a quiz, exercises, and on-demand deep dives per section. Grounded in the abstract, never invented.

Discussion (0)

Sign in to join the discussion.

Loading comments…