Improving Optical Metrology by Engineering the Target Environment

Abstract

Measurements of positional coordinates and dimensions - whether by human vision or optical instrumentation - are fundamental to safety, industrial productivity, manufacturing quality/accuracy, and scientific discovery. The ultimate precision of such measurements is governed by the Fisher information conveyed from an object to a detector through the optical field, and strategies for enhancing measurement performance often focus on reducing detector noise and/or refining estimation algorithms. Building on the emerging understanding of Fisher information as a physical quantity that propagates through space in a wave-like fashion, we demonstrate that substantial gains in precision can also be made by engineering the electromagnetic environment of a measurement target to optimise the generation and transmission of Fisher information. Using nanowire position metrology based on light scattering at a wavelength λ = 640 nm as an architype system, we achieve a multifold enhancement in localisation precision, reaching beyond λ/10,000. Our results establish target environment engineering as a powerful and broadly applicable strategy for advancing measurement and sensing performance across platforms ranging from optical characterisation of micro- and nano-objects to microwave radars and optical LiDAR navigation systems.