Barrier-channel intermixing and 2-dimensional electron gas degradation in Al-rich Al(Ga)N/AlGaN high electron mobility transistor heterostructures

Abstract

In this work, we report on recent results in understanding and addressing the issue of interface smearing in high-aluminium content AlGaN/AlGaN heterostructures. On the one hand, the growth of high-crystal quality AlGaN by metal-organic vapour phase epitaxy (MOVPE) requires the use of high temperatures, but on the other hand this may lead to alloy intermixing between barrier and channel layers, which smoothens out the polarization contrast and severely degrades or even completely destroys the 2-dimensional electron gas (2DEG). We show that X-Ray Diffraction (XRD) analysis can be used as a non-destructive way to assess the sharpness of the interface, and that improved growth schemes can be successfully used to achieve high-quality 2DEG, as confirmed by contactless resistivity measurements. In particular, sheet resistivities around 2,500 $Ω/\Box$ were demonstrated for AlN/Al$_{0.75}$Ga$_{0.25}$N, consistent with the best-reported values in the literature.