Tight Sample Complexity of Transformers

Abstract

We tightly characterize the VC dimension of depth-$L$ Transformers with a total of $W$ parameters, mapping an input sequence of length $T$ to a single output, establishing an upper bound of $O(L W \log (T W))$ and a nearly matching lower bound of $Ω(L W \log (T W / L))$. We further tightly characterize the sample complexity of chain-of-thought learning using such a Transformer, showing teacher forcing (i.e. selecting a predictor consistent with the entire chain-of-thought on training data) learns with sample complexity $O\left(L W \log \left(\left(T+T^{\prime}\right) W\right)\right)$ and that any learning rule that uses chain-of-thought data requires at least $Ω\left(L W \log \left(\left(T+T^{\prime}\right) W / L\right)\right)$ examples, where $T$ is the input length and $T^{\prime}$ is the number of autoregressive steps.