Multi-level π-junction in a proximitized Ge/SiGe quantum dot probed by an on-chip superconducting microwave resonator

Abstract

Using on-chip microwave measurements, we investigate multilevel $π$-junctions formed by proximitized quantum dot (QD) in a germanium (Ge)/silicon-germanium (SiGe) heterostructure. In the multilevel regime, where several QD orbitals contribute simultaneously to superconducting transport, the Josephson ground state is no longer determined solely by the occupation of a single orbital. By combining DC transport and microwave techniques, we identify the qualitative signatures of multilevel $π$-junctions in both their gate-voltage dependence and microwave response. In particular, we observe combinations phase transitions that are sharp or smooth in gate voltage and which exhibit distinct inductive and dissipative signatures. Such multilevel Josephson transport has previously been observed primarily in exceptionally clean systems such as carbon nanotubes. Our results establish proximitized Ge as a platform for investigating hybrid superconductor/semiconductor physics and demonstrate the integration of gate-defined superconducting quantum devices with high-quality on-chip microwave resonators.