X-ray scattering study of two length scales in the critical fluctuations of CuGeO3
Abstract
The critical fluctuations of CuGeO3 have been measured by synchrotron x-ray scattering, and two length scales are clearly observed. The ratio between the two length scales is found to be significantly different along the a axis, with the a axis along the surface normal direction. We believe that such a directional preference is a clear sign that surface random strains, especially those caused by dislocations, are the origin of the long length scale fluctuations.
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