Phase transitions, stability, and dielectric response of the domain structure in ferroelectric-ferroelastic thin films
Abstract
We present the first analytical study of phase transitions in ferroelastic-ferroelectric epitaxial thin films on exactly solvable model. The emerging domain structure with domains of equal width (which may be exponentially large on a "soft" substrate) always remains stable irrespective of the film thickness. The dielectric response of an epitaxial film is smaller than that of a free film, in striking contrast with assertions in the literature.
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