Doping induced charge redistribution in the high temperature superconductor HgBa2CuO4
P. Süle, C. Ambrosch-Draxl, H. Auer, E. Y. Sherman
Abstract
To understand the link between doping and electronic properties in high temperature superconductors, we report first-principles calculations on the oxygen doping effect for the single layer cuprate HgBa2CuO4+δ. The doping effect is studied both by supercell and single cell virtual crystal type approaches. We find ionic behavior of the dopant atom up to an optimal doping concentration of δ=0.22. The excess oxygen attracts electrons from the CuO2 plane leading to an increase of the hole concentration in this building block. The maximum amount of holes is reached when the oxygen p-shell is nearly completely filled. As a consequence the density of states at the Fermi level exhibits a pronounced maximum at the optimal oxygen content. The calculated hole content as a function of doping is in accordance with experimental findings.
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