Universal Temperature Behavior of Remanent Magnetization Observed in Low-Tc and High-Tc Josephson Junction Arrays

Abstract

A comparative study of the magnetic remanence exhibited by tridimensional Josephson junction arrays in response to an excitation with an AC magnetic field is presented. The observed temperature behavior of the remanence curves for disordered arrays fabricated from three different materials (Nb, YBa_2Cu_3O_7 and La_{1.85}Sr_{0.15}CuO_4) is found to follow the same universal law (based on the explicit temperature expressions for the activation energy and the inductance-dominated contribution to the magnetization of the array within the framework of the phase-slip model) regardless of the origin of the superconducting electrodes of the junctions which form the array.