Magnetoresistances observed by decomposition of the magnetic moment in La1-xCaxMnO3 films
Abstract
A ferromagnetic phase, characterized by electron carriers and a high temperature colossal magnetoresistance (HTCMR) dependent on the magnetic moment, and a semiconducting phase, characterized by hole carriers and a low temperature CMR (LTCMR), are observed in La1-xCaxMnO3 thin films by the van der Pauw method. The LTCMR is much more sensitive to the magnetic field than the HTCMR. In the ferromagnetic phase for films with anisotropic moments in two dimensions, a remnant resistivity of the order of 10-8 \~m is observed up to 100 K and increases exponentially with both a temperature up to Tc and a magnetic field above one Tesla (a positive magnetoresistivity). We found that the ferromagnetic phase below Tc is in a polaronic state with a polaronic mobile conduction, and the carrier density dips near Tc. For resistances measured by the four-probe method with line electrodes, low temperature information of the HTCMR is not revealed. The van der Pauw method is more effective for the resistance measurement of a magnetic material than the four-probe method.
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