Evidence of potential sputtering of ultra-thin Pt films due to impact of multi-charged Ar ions
D. Ghose, P. Karmakar
Abstract
The phenomenon of potential sputtering of ultra-thin Pt films due to impact of 20 keV highly charged Arq+ (q = 3 - 8) ions has been investigated. The results show enhanced erosion of the Pt film with the increase of potential energy of the Ar projectile.
Create a lesson
Related papers
Ferron polariton Hall effect: Deflecting optically rectified polarization with magnetic fields
Omer Yaniv, Dominik M. Juraschek
Band structure of two-dimensional graphene and of one-dimensional nanoribbons via variational quantum algorithms: from energies to wavefunction quality
Raúl Medrano Millán, Rodrigo Gil-Merino y Rubio, Juan Borge et al.
Aging-Improved NH3 Sensing in Polypyrrole Nanotube Chemiresistors
Arya Mohan, Olivia Kamdom, Antoine Enel et al.
Effect of molybdenum content on phase transformations during continuous heating of metastable β Ti-Mo alloys
Veronika Kočiščáková, Anna Veverková, Josef Stráský et al.
Controlling nitrogen incorporation in (Eu,Ba,Ca)TiO3-derived perovskite-type oxynitrides through Fermi Level Engineering
Margarida Barroso, Marie Neumann, Rachele Sciotto et al.
Effect of compensation on magnetic ordering in (Ga,Mn)As
I. A. Kokurin, N. S. Averkiev