A low density finite temperature apparent "insulating" phase in 2D systems
Abstract
We propose that the observed low density ``insulating'' phase of a 2D semiconductor system, with the carrier density being just below (n < nc) the so-called critical density where the derivative of resistivity changes sign at low temperatures (i.e. resistivity (T) increases with increasing T for n > nc whereas it decreases with increasing T for n < nc), is in fact a ``high-temperature'' crossover version of the same effective metallic phase seen at higher densities (n>nc). This low density (n<nc) finite temperature crossover 2D effective insulating phase is characterized by (T) with power law temperature dependence in contrast to the truly insulating state (occurring at still lower densities) whose resistivity increases exponentially with decreasing temperature.
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