A Novel Dielectric Anomaly in Cuprates and Nickelates: Signature of an Electronic Glassy State
Abstract
The low-frequency dielectric response of hole-doped insulators La2Cu1-xLixO4 and La2-xSrxNiO4 shows a large dielectric constant ε ' at high temperature and a step-like drop by a factor of 100 at a material-dependent low temperature Tf. Tf increases with frequency and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge glass state is realized both in the cuprates and in the nickelates.
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