Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of Si:Theoretical Analysis
Yunori Nisikawa, Manabu Usuda, Jun-ichi Igarashi
Abstract
We investigate theoretically the resonant inelastic x-ray scattering (RIXS) at the K edge of Si on the basis of an ab initio calculation. We calculate the RIXS spectra with systematically varying transfered-momenta, incident-photon energy and incident-photon polarization. We confirm the anisotropy of the experimental spectra by Y. Ma et al. (Phys. Rev. Lett. 74, 478 (1995)), providing a quantitative explanation of the spectra.
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