In situ photoemission study on atomically-controlled La1-xSrxMnO3 thin films: Composition dependence of the electronic structure

Abstract

We have investigated change in the electronic structures of atomically-controlled La1-xSrxMnO3 (LSMO) thin films as a function of hole-doping level (x) in terms of in situ photoemission spectroscopy (PES) and x-ray absorption spectroscopy (XAS) measurements. The in situ PES measurements on a well-ordered surface of high-quality epitaxial LSMO thin films enable us to reveal their intrinsic electronic structures, especially the structure near the Fermi level (EF). We have found that overall features of valence band as well as the core levels monotonically shifted toward lower binding energy as x was increased, indicating the rigid-band like behavior of underlying electronic structure of LSMO thin films. The peak nearest to EF due to the eg orbital is also found to move toward EF in a rigid-band manner, while the peak intensity decreases with increasing x. The loss of spectral weight with x in the occupied density of states was compensated by simultaneous increment of the shoulder structure in O 1s XAS spectra, suggesting the existence of a pseudogap, that is depression in spectral weight at EF, for all metallic compositions. These results indicate that the simple rigid-band model does not describe the electronic structure near EF of LSMO and that the spectral weight transfer from below to above EF across the gap dominates the spectral changes with x in LSMO thin films.

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